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On the photoluminescence theory in nanocrystalline silicon: A new improvement

dc.creatorRamírez Porras, Arturo
dc.creatorPrado Bermúdez, Isaac José
dc.date.accessioned2026-04-29T14:09:07Z
dc.date.issued2025-09-23
dc.description.abstractWe present an improved model for photoluminescence (PL) in nanocrystalline silicon based on LogNormal size distributions of quantum wires (QWs) and quantum dots (QDs). The model predicts four spectral components: band-to-band and localized-to-band recombinations in both QWs and QDs. This approach also captures the influence of oxide-related surface states. Experimental validation with porous silicon films, using Fourier-transform infrared and fluorescence spectroscopy, confirms the presence of oxide bands and supports the predicted PL contributions. The model provides a consistent framework for interpreting PL spectra and extracting nanostructure size distributions in silicon photonics.
dc.description.procedenceUCR::Vicerrectoría de Investigación::Unidades de Investigación::Ciencias Básicas::Centro de Investigación en Ciencia e Ingeniería de Materiales (CICIMA)
dc.description.sponsorshipUniversidad de Costa Rica/[816-C3182]/UCR/Costa Rica
dc.identifier.codproyecto816-C3182
dc.identifier.doihttps://doi.org/10.1063/5.0293503
dc.identifier.urihttps://hdl.handle.net/10669/104304
dc.language.isoeng
dc.rightsacceso embargado
dc.sourceJournal of Applied Physics, 138(12)
dc.subjectPorous Silicon
dc.subjectMaterials Science
dc.subjectSpectroscopy
dc.titleOn the photoluminescence theory in nanocrystalline silicon: A new improvement
dc.typeartículo original

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