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Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films
| dc.creator | Ramírez Porras, Arturo | |
| dc.creator | Fonseca, L. F. | |
| dc.creator | Resto, O. | |
| dc.date.accessioned | 2010-08-03T02:17:42Z | |
| dc.date.available | 2010-08-03T02:17:42Z | |
| dc.date.issued | 2003 | |
| dc.identifier.citation | http://www.mrs.org/s_mrs/sec_subscribe.asp?CID=2555&DID=117919&action=detail | |
| dc.identifier.uri | https://hdl.handle.net/10669/329 | |
| dc.description.abstract | A stochastic distribution of nanocrystalline sizes model is applied to fit photoluminescence (PL) spectra of luminescent Si nanocrystals in a Si/SiO2 matrix synthesized by RF co-sputtering on the top of quartz substrates. With this method, the PL spectra from a diverse set of samples can be resolved mainly as the sum of two components: a contribution from a gaussian-like distribution of sizes of quantum dots (QD) and a similar component from a distribution of quantum wires (QW). These distributions of sizes and their associated PL energies agree well with the so-called Smart Quantum Confinement model (SQC). | en |
| dc.description.sponsorship | Vicerrectoría de Investigación (UCR), Comisión Nacional de Investigaciones Científicas y Tecnológicas (CONICIT); Ministerio de Ciencia y Tecnología (MICIT); Fundación de la Universidad de Costa Rica para la Investigación (FUNDEVI). Contrapartidas externas: U.S. Army Research Office (grant #41002-MS-DPS); NASA (grant #NCC5-518). | es_ES |
| dc.language.iso | en_US | es_ES |
| dc.publisher | Materials Research Society Symposium Proceedings 737 (2003) | en |
| dc.subject | Silicio poroso | es_ES |
| dc.subject | Confinamiento cuántico | es_ES |
| dc.title | Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films | en |
| dc.type | artículo original | |
| dc.description.procedence | UCR::Vicerrectoría de Investigación::Unidades de Investigación::Ciencias Básicas::Centro de Investigación en Ciencia e Ingeniería de Materiales (CICIMA) | es_ES |
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