Listar Volumen 21, Números 1 y 2 por autor "eceeb71a-e902-4130-aeca-5b785c0c0db1"
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Nanostructure size determination in N+- type porous silicon bY X-Rya diffractometry and Raman Spectroscopy
Ramírez Porras, Arturo (2011-02-07)A series of porous silicon surfaces were obstained after different exposition times of electrochemiscal etching on crystaline n+- type silicon in presence of hydrofluoric acid. These kind of surfaces show photoluminescence ...